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Eur J Cardiothorac Surg 2001;20:1075-1076
© 2001 Elsevier Science NL
Letter to the Editor |
Center for Less Invasive and Robotic Heart Surgery, Buffalo, NY, USA
Received 29 June 2001; accepted 20 July 2001.
Corresponding author. 100 High Street, Buffalo, NY 14203, USA. Tel.: +1-716-859-2248; fax: +1-716-859-2885
e-mail: lisbon5{at}yahoo.com
We read with interest Hirotani et al. manuscript [1] about intraoperative graft patency verification using transit time flow measurement (TTFM). The authors report their results with intraoperative TTFMs and postoperative angiography concluding that intraoperative coronary bypass flow is not, per se, a good predictor of graft stenosis.
We have been using TTFM technology since 1996 [2] to evaluate graft patency in more than 1200 patients. In our opinion strict protocols should be followed to correctly interpret TTFM findings.
L/
r4, R=vascular resistance,
=blood viscosity, L=conduit length, r=vessel's radius). For this reason, absolute blood flow is not a good predictor of anastomotic quality because high vascular resistances may exist in spite of fully patent anastomoses. The PI, expressed as an absolute number, is a good indicator of the flow pattern and, consequently, of the quality of the anastomosis. This number is obtained by dividing the difference between the maximum and the minimum flow by the value of the mean flow. In our experience, the PI should be between 1 and 5. The possibility of a technical error in the anastomosis increases for higher PI values [2,3].
In conclusion we agree that mean graft flow, being very dependent by the quality of the revascularized coronary artery, is not per se a good indicator of the quality of the anastomosis. On the contrary, TTFM technology may be very useful if mean flow values are interpreted together with TTF curves and PI values. Although there is still necessity to define the sensitivity of TTFM in detecting less then critical stenosis, correct and simultaneous interpretation of flow curves, mean flows, and PI values is crucial to reduce the number of undetected technical errors.
References
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