EJCTS -- Index by Author (Nov 2001; 20, Number 5)

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Index by Author: Nov 2001; 20 (5) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aarts, L.P.H.J. [Abstract] [Full Text]; Abildgaard, Ulrik [Abstract] [Full Text]; Akal, Murat [Abstract] [Full Text]; Akay, Hadi [Abstract] [Full Text]; Akchurin, R.S. [Abstract] [Full Text]; Alexi-Meskishvili, Vladimir [Abstract] [Full Text]; Alpay, A. Levent [Abstract] [Full Text]; Anderson, R.H. [Full Text]; Aoki, Hidetoshi [Abstract] [Full Text]; Arinaga, Kouich [Abstract] [Full Text]; Atasalihi, Ali [Abstract] [Full Text]; Augustin, Norbert [Abstract] [Full Text]
B: Bagirov, M.M. [Abstract] [Full Text]; Baschwitz Gómez, B. [Full Text]; Belcher, P.R. [Full Text]; Bergsland, Jacob [Full Text]; Bertin, F. [Abstract] [Full Text]; Bingold, T.M. [Abstract] [Full Text]; Biswas, S. [Abstract] [Full Text]; Blackstone, Eugene H. [Abstract] [Full Text]; Bokhyan, V. [Full Text]; Bonacchi, M. [Full Text]; Borghetti, Valentino [Abstract] [Full Text]; Buth, K.J. [Abstract] [Full Text]
C: Cartier, Raymond [Abstract] [Full Text]; Casha, A.R. [Full Text]; Ceconi, Claudio [Abstract] [Full Text]; Chevalley, Catherine [Abstract] [Full Text]; Christensen, John [Abstract] [Full Text]; Clements, F. [Abstract] [Full Text]; Coddens, José [Full Text]; Coletti, Giuseppe [Abstract] [Full Text]; Cooper, G.J. [Full Text]; Corbineau, Hervé [Abstract] [Full Text]; Cornu, E. [Abstract] [Full Text]
D: D'Ancona, Giuseppe [Full Text]; Danton, Mark [Full Text]; Davydov, M. [Full Text]; Davydov, M.I. [Abstract] [Full Text]; Demers, Philippe [Abstract] [Full Text]; Deshpande, R. [Full Text]; Dhaliwal, Rajinder S. [Full Text]; di Summa, Michele [Full Text]; Diodato, L. [Abstract] [Full Text]; Dittrich, Sven [Abstract] [Full Text]; Döner, Egemen [Abstract] [Full Text]; Driessen, A.H.G. [Abstract] [Full Text]
E: Elagoz, S. [Full Text]; Endo, Shunsuke [Abstract] [Full Text]
F: Fallenberg, E.M. [Abstract] [Full Text]; Fanelli, F. [Abstract] [Full Text]; Fruergaard, Kim [Abstract] [Full Text]; Fucci, Carlo [Full Text]
G: Galbis Caravajal, J.M. [Full Text]; Gauci, M. [Full Text]; Gerasimov, S.S. [Abstract] [Full Text]; Gerritsen, W.B.M. [Abstract] [Full Text]; Giunti, G. [Full Text]; Go, Tetsuhiko [Abstract] [Full Text]; Goldsmith, Ira R.A. [Abstract] [Full Text]; Grasso, Francesco [Abstract] [Full Text]; Gürses, Atilla [Full Text]
H: Haas, F.J.L.M. [Abstract] [Full Text]; Hagl, S. [Abstract] [Full Text]; Halezeroglu, Semih [Abstract] [Full Text]; Hamada, Yoshihiro [Full Text]; Heroor, A. [Full Text]; Hetzer, Roland [Abstract] [Full Text]; Hindricks, Gerhard [Abstract] [Full Text]; Hirotani, Takashi [Full Text]; Hirsch, G.M. [Abstract] [Full Text]; Hoffmeier, A. [Abstract] [Full Text]; Holme, Susanne [Abstract] [Full Text]; Hughes, G. Chad [Abstract] [Full Text]; Hukins, D.W.L. [Full Text]
I: Ishii, Osamu [Abstract] [Full Text]
J: Jeffrey, R.R. [Full Text]; Jutley, R.S. [Full Text]
K: Kaptanoglu, M. [Full Text]; Karamanoukian, Hratch L. [Full Text]; Kashu, Yasuaki [Full Text]; Kassis, Eli [Abstract] [Full Text]; Kavukçu, Sevket [Abstract] [Full Text]; Kawachi, Kanji [Full Text]; Kawachi, Yoshito [Abstract] [Full Text]; Kawano, Hiroshi [Abstract] [Full Text]; Kay, P.H. [Full Text]; Kentala, Erkki [Abstract] [Full Text]; Khatchatourian, Gregory [Abstract] [Full Text]; Kiliç, Dalokay [Abstract] [Full Text]; Kim, H.M. [Abstract] [Full Text]; Kim, K.T. [Abstract] [Full Text]; Kir, Altan [Abstract] [Full Text]; Koch, Achim [Abstract] [Full Text]; Kononets, P.V. [Abstract] [Full Text]; Konstantinov, Igor E. [Abstract] [Full Text]; Kostolny, Martin [Abstract] [Full Text]; Kotsuka, Yutaka [Abstract] [Full Text]; Kottkamp, Hans [Abstract] [Full Text]; Krishnamoorthy, K.M. [Abstract] [Full Text]; Kunihara, Takashi [Abstract] [Full Text]
L: La Canna, Giovanni [Abstract] [Full Text]; Landolfo, K. [Abstract] [Full Text]; Langanay, Thierry [Abstract] [Full Text]; Lange, Peter E. [Abstract] [Full Text]; Lange, Rüdiger [Abstract] [Full Text]; Laskar, M. [Abstract] [Full Text]; Le Guyader, A. [Abstract] [Full Text]; Légaré, J.F. [Abstract] [Full Text]; Leguerrier, Alain [Abstract] [Full Text]; Licker, Marc [Abstract] [Full Text]; Lip, Gregory Y.H. [Abstract] [Full Text]; Lorusso, Roberto [Abstract] [Full Text]; Lu, J. [Abstract] [Full Text]; Lund, Ole [Abstract] [Full Text]
M: MacDougall, C. [Abstract] [Full Text]; Machaladze, Z.A. [Abstract] [Full Text]; Mafé Madueño, J.J. [Full Text]; Matsuura, Yuichiro [Abstract] [Full Text]; Mazzesi, G. [Abstract] [Full Text]; Ménestret, Pascal [Abstract] [Full Text]; Metin, Muzaffer [Full Text]; Meyer, Rudolf [Abstract] [Full Text]; Minzioni, Gaetano [Abstract] [Full Text]; Minzioni, Gaetano [Full Text]; Miraldi, F. [Abstract] [Full Text]; Misawa, Yoshio [Abstract] [Full Text]; Miyairi, Takeshi [Abstract] [Full Text]; Mohr, Friedrich [Abstract] [Full Text]; Morota, Tetsuro [Abstract] [Full Text]; Murakami, Arata [Abstract] [Full Text]; Murashita, Toshifumi [Abstract] [Full Text]; Muriithi, E.W. [Full Text]; Myojin, Kazuhiro [Abstract] [Full Text]
N: Nadir, A. [Full Text]; Nadir, Aydin [Abstract] [Full Text]; Nakashima, Atsuhiro [Abstract] [Full Text]; Nakata, Tatsuhiro [Full Text]
O: Oberländer, J. [Abstract] [Full Text]; Oda, Makoto [Abstract] [Full Text]; Ohta, Yasuhiko [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Ökten, Ilker [Abstract] [Full Text]; Okur, Erdal [Abstract] [Full Text]; Olesen, Arne [Abstract] [Full Text]; Ono, Minoru [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Otto, H.F. [Abstract] [Full Text]; Özdemir, Nezih [Abstract] [Full Text]
P: Page, R.D. [Abstract] [Full Text]; Parrinello, Giovanni [Abstract] [Full Text]; Pastorino, Ugo [Abstract] [Full Text]; Patanè, Francesco [Full Text]; Patel, Ramesh L. [Abstract] [Full Text]; Pees, Christiane [Abstract] [Full Text]; Polotsky, B.E. [Abstract] [Full Text]; Poullis, M. [Abstract] [Full Text]; Präuer, Heinz [Abstract] [Full Text]; Prifti, E. [Full Text]
R: Rao, S. [Abstract] [Full Text]; Rauch, Thomas [Abstract] [Full Text]; Rodriguez Paniagua, J.M. [Full Text]
S: Sack, F.-U. [Abstract] [Full Text]; Saito, Noriko [Abstract] [Full Text]; Sani, G. [Full Text]; Saoji, R. [Full Text]; Saraste, Antti [Abstract] [Full Text]; Savunen, Timo [Abstract] [Full Text]; Sayar, Adnan [Full Text]; Scheld, H.H. [Abstract] [Full Text]; Schmitz, Christoph [Abstract] [Full Text]; Schnabel, Ph.A. [Abstract] [Full Text]; Schroeyers, Pascal [Full Text]; Semik, M. [Abstract] [Full Text]; Shackcloth, M.J. [Abstract] [Full Text]; Sharma, S. [Full Text]; Shepherd, D.E.T. [Full Text]; Shibata, Ko [Abstract] [Full Text]; Shiiya, Norihiko [Abstract] [Full Text]; Shin, J.S. [Abstract] [Full Text]; Sohara, Yasunori [Abstract] [Full Text]; Sokolov, V.V. [Abstract] [Full Text]; Solli, Piergiorgio [Abstract] [Full Text]; Spaggiari, Lorenzo [Abstract] [Full Text]; Spiliopoulos, Anastase [Abstract] [Full Text]; Stilidi, I. [Full Text]; Stilidi, I.S. [Abstract] [Full Text]; Stiller, Brigitte [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Sullivan, J.A. [Abstract] [Full Text]; Sun, K. [Abstract] [Full Text]
T: Takamoto, Shinichi [Abstract] [Full Text]; Toker, Alper [Full Text]; Toshima, Yoshihiro [Abstract] [Full Text]; Totaro, M. [Abstract] [Full Text]; Totaro, Pasquale [Full Text]; Totaro, Pasquale [Abstract] [Full Text]; Tsunezuka, Yoshio [Abstract] [Full Text]
U: Ueno, Katsuhito [Abstract] [Full Text]; Uotila, Pekka [Abstract] [Full Text]
V: Vähäsilta, Tommi [Abstract] [Full Text]; van Boven, W.J.P. [Abstract] [Full Text]; van Son, Jacques A.M. [Abstract] [Full Text]; Vanermen, Hugo [Full Text]; Verhoye, Jean-Philippe [Abstract] [Full Text]; Vermeulen, Yvette [Full Text]; Verzini, Alessandro [Full Text]; von Oppell, Ulrich O. [Abstract] [Full Text]
W: Watanabe, Go [Abstract] [Full Text]; Watanabe, Shun-ichi [Abstract] [Full Text]; Watanabe, Yoh [Abstract] [Full Text]; Watari, Masanobu [Abstract] [Full Text]; Wilhelmi, M. [Full Text]; Wolf, Randall K. [Full Text]
Y: Yang, L. [Full Text]; Yasuda, Keishu [Abstract] [Full Text]; Yildiz, E. [Full Text]
Z: Zimmermann, Volker [Abstract] [Full Text]; Zingarelli, Edoardo [Full Text]