EJCTS -- Index by Author (May 2006; 29, Number 5)

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Index by Author: May 2006; 29 (5) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abunasra, Haitham [Abstract] [Full Text]; Addicks, Klaus [Abstract] [Full Text]; Alphonso, Nelson [Abstract] [Full Text]; Alphonso, Nelson [Abstract] [Full Text]; Anile, Marco [Extract] [Full Text]; Arifi, Ahmed A. [Abstract] [Full Text]
B: Barron, David J. [Abstract] [Full Text]; Barron, David J. [Abstract] [Full Text]; Beggs, David [Abstract] [Full Text]; Benussi, Bernardo [Abstract] [Full Text]; Beyersdorf, Friedhelm [Abstract] [Full Text]; Bical, Olivier M. [Abstract] [Full Text]; Biondi-Zoccai, Giuseppe G.L. [Extract] [Full Text]; Blackstone, Eugene H. [Abstract] [Full Text]; Bloch, Wilhelm [Abstract] [Full Text]; Boku, Noriko [Abstract] [Full Text]; Boodhwani, Munir [Abstract] [Full Text]; Brawn, William J. [Abstract] [Full Text]; Brawn, William J. [Abstract] [Full Text]; Brizard, Christian P. [Abstract] [Full Text]; Brizard, Christian P. [Abstract] [Full Text]; Brown, John W. [Abstract] [Full Text]; Browne, John [Abstract] [Full Text]
C: Cademartiri, Filippo [Extract] [Full Text]; Candura, Dario [Extract] [Full Text]; Carr, John Alfred [Extract] [Full Text]; Caus, Thierry [Extract] [Full Text]; Chambers, David J. [Extract] [Full Text]; Chan, Michael C.W. [Abstract] [Full Text]; Chello, Massimo [Extract] [Full Text]; Chon, Soon-Ho [Abstract] [Full Text]; Chow, Louis T.C. [Abstract] [Full Text]; Christodoulou, Michel [Abstract] [Full Text]; Chung, Won Sang [Abstract] [Full Text]; Ciccone, Anna Maria [Abstract] [Full Text]; Cimen, Serdar [Abstract] [Full Text]; Clements, Richard [Abstract] [Full Text]; Cochrane, Andrew D. [Abstract] [Full Text]; Cochrane, Andrew D. [Abstract] [Full Text]; Cole, Timothy J. [Abstract] [Full Text]; Czerny, Martin [Abstract] [Full Text]
D: D’Andrilli, Antonio [Abstract] [Full Text]; D’Errigo, Paola [Extract] [Full Text]; D’Errigo, Paola [Extract] [Full Text]; D’Errigo, Paola [Extract] [Full Text]; d’Udekem, Yves [Abstract] [Full Text]; Dashkevich, Alexey [Abstract] [Full Text]; De Giacomo, Tiziano [Abstract] [Full Text]; De Giovanni, Joe V. [Abstract] [Full Text]; de Leval, Marc R. [Abstract] [Full Text]; Deleuze, Philippe [Abstract] [Full Text]; Demirag, Funda [Abstract] [Full Text]; Demirtas, Murat [Abstract] [Full Text]; Desimonas, Nikolaos A. [Extract] [Full Text]; Dewey, Todd [Abstract] [Full Text]; Di Stasio, Mario [Extract] [Full Text]; Dittrich, Sven [Abstract] [Full Text]; Doss, Mirko [Abstract] [Full Text]; Dreas, Lorella [Abstract] [Full Text]; Dudler, Jean [Abstract] [Full Text]; Duffy, John P. [Abstract] [Full Text]
E: Egan, Jim J. [Abstract] [Full Text]; Elliott, Martin J. [Abstract] [Full Text]; Eto, Masataka [Abstract] [Full Text]
F: Fabri, Brian M. [Abstract] [Full Text]; Feng, Jun [Abstract] [Full Text]; Ferguson, Jonathan [Abstract] [Full Text]; Fiorini, Emma [Abstract] [Full Text]; Fischer, Marc [Abstract] [Full Text]; Fischer, Uwe M. [Abstract] [Full Text]; Fitzpatrick, John [Abstract] [Full Text]; Fleury, Sylvain [Abstract] [Full Text]; Foroulis, Christophoros N. [Extract] [Full Text]; Fries, Jochen W.U. [Abstract] [Full Text]; Fromes, Yves [Abstract] [Full Text]; Fujii, Masahiro [Extract] [Full Text]; Fusaro, Massimiliano [Extract] [Full Text]; Fusco, Danilo [Extract] [Full Text]; Fusco, Danilo [Extract] [Full Text]; Fusco, Danilo [Extract] [Full Text]
G: Gaillard, Didier [Abstract] [Full Text]; Gallivan, Steve [Abstract] [Full Text]; Gatti, Giuseppe [Abstract] [Full Text]; Geissler, Hans J. [Abstract] [Full Text]; Gerhardt, Marie-Françoise [Abstract] [Full Text]; Gottardi, Roman [Abstract] [Full Text]; Grabenwoger, Martin [Abstract] [Full Text]; Grayson, Antony D. [Abstract] [Full Text]; Grimm, Michael [Abstract] [Full Text]; Griselli, Massimo [Abstract] [Full Text]; Gulhan, Erkmen [Abstract] [Full Text]
H: Hambrecht, Rainer [Abstract] [Full Text]; Hanley, Frank L. [Extract] [Full Text]; Healy, David G. [Abstract] [Full Text]; Hekmat, Khosro [Extract] [Full Text]; Hillinger, Sven [Abstract] [Full Text]; Hurley, John [Abstract] [Full Text]
I: Ibrahim, Mohsen [Abstract] [Full Text]; Imai, Katsuhiko [Abstract] [Full Text]; Inglese, Luigi [Extract] [Full Text]; Isaka, Mitsuhiro [Abstract] [Full Text]; Izumoto, Hiroshi [Extract] [Full Text]
J: Jayakumar, Jay [Abstract] [Full Text]; Jeremy, Jamie Y. [Abstract] [Full Text]
K: Kajihara, Noriyoshi [Abstract] [Full Text]; Kang, Nicholas [Abstract] [Full Text]; Kappenberger, Lukas [Abstract] [Full Text]; Kestenholz, Peter B. [Abstract] [Full Text]; Ketenci, Bulend [Abstract] [Full Text]; Kim, Hyuck [Abstract] [Full Text]; Kim, Hyun Koo [Extract] [Full Text]; Kim, Woong-Han [Extract] [Full Text]; Kim, Young Hak [Abstract] [Full Text]; Krestin, Gabriel P. [Extract] [Full Text]; Kuduvalli, Manoj [Abstract] [Full Text]; Kuhn-Régnier, Ferdinand [Abstract] [Full Text]; Kumagai, Hajime [Abstract] [Full Text]
L: Laker, Simon [Abstract] [Full Text]; Laker, Simon J. [Abstract] [Full Text]; Laks, Hillel [Abstract] [Full Text]; Lammer, Johannes [Abstract] [Full Text]; Lardinois, Didier [Abstract] [Full Text]; Lattuada, Luca [Abstract] [Full Text]; Lee, Chul Burm [Abstract] [Full Text]; Lee, Tak-Wai [Abstract] [Full Text]; Li, Jianping [Abstract] [Full Text]; Lima, Brian [Abstract] [Full Text]
M: Mack, Michael [Abstract] [Full Text]; Maguire, Michael F. [Abstract] [Full Text]; Massullo, Domenico [Abstract] [Full Text]; Mastrobuoni, Stefano [Extract] [Full Text]; Mazzucco, Alessandro [Extract] [Full Text]; McCarthy, James F. [Abstract] [Full Text]; McGuirk, Simon P. [Abstract] [Full Text]; Mehlhorn, Uwe [Abstract] [Full Text]; Mehlhorn, Uwe [Extract] [Full Text]; Meijboom, Willem B. [Extract] [Full Text]; Menahem, Samuel [Abstract] [Full Text]; Menicanti, Lorenzo A. [Extract] [Full Text]; Menicanti, Lorenzo A. [Extract] [Full Text]; Messina, Antonio [Extract] [Full Text]; Mieno, Shigetoshi [Abstract] [Full Text]; Milano, Carmelo A. [Abstract] [Full Text]; Mishra, Pankaj Kumar [Extract] [Full Text]; Mishra, Pankaj Kumar [Abstract] [Full Text]; Mishra, Pankaj Kumar [Extract] [Full Text]; Mishra, Pankaj Kumar [Extract] [Full Text]; Mohr, Friedrich W. [Abstract] [Full Text]; Monro, James L. [Extract] [Full Text]; Morita, Shigeki [Abstract] [Full Text]
N: Naalsund, Anne [Abstract] [Full Text]; Newall, Nick [Abstract] [Full Text]; Newcomb, Andrew E. [Abstract] [Full Text]; Ng, Calvin S.H. [Abstract] [Full Text]; Nishida, Takahiro [Abstract] [Full Text]; Nørgaard, Martin A. [Abstract] [Full Text]; Nørgaard, Martin A. [Abstract] [Full Text]; Norstein, Jarle [Abstract] [Full Text]
O: O’Keane, Conor [Abstract] [Full Text]; Odim, Jonah [Abstract] [Full Text]; Okada, Kenji [Abstract] [Full Text]; Okada, Yuji [Abstract] [Full Text]; Orihashi, Kazumasa [Abstract] [Full Text]; Ozay, Batuhan [Abstract] [Full Text]
P: Pappalardo, Aniello [Abstract] [Full Text]; Perrault, Louis P. [Extract] [Full Text]; Perucci, Carlo Alberto [Extract] [Full Text]; Perucci, Carlo Alberto [Extract] [Full Text]; Perucci, Carlo Alberto [Extract] [Full Text]; Pezzetta, Edgardo [Abstract] [Full Text]; Pinto, Giovanni [Abstract] [Full Text]; Ponzio, Olivier [Abstract] [Full Text]; Pugliese, Francesca [Extract] [Full Text]
R: Ramlawi, Basel [Abstract] [Full Text]; Rauber, Elisabetta [Abstract] [Full Text]; Ravenscroft, Andrew [Abstract] [Full Text]; Rendina, Erino A. [Abstract] [Full Text]; Ris, Hans-Beat [Abstract] [Full Text]; Rodefeld, Mark D. [Abstract] [Full Text]; Rogers, Joseph G. [Abstract] [Full Text]; Rostad, Hans [Abstract] [Full Text]; Ruzmetov, Mark [Abstract] [Full Text]
S: Santini, Francesco [Extract] [Full Text]; Sayin, Omer Ali [Extract] [Full Text]; Schlensak, Christian [Abstract] [Full Text]; Schneiter, Didier [Abstract] [Full Text]; Schoder, Maria [Abstract] [Full Text]; Schroder, Jacob N. [Abstract] [Full Text]; Schuler, Gerhard [Abstract] [Full Text]; Seccareccia, Fulvia [Extract] [Full Text]; Seccareccia, Fulvia [Extract] [Full Text]; Seccareccia, Fulvia [Extract] [Full Text]; Sedrakyan, Artyom [Abstract] [Full Text]; Sellke, Frank W. [Abstract] [Full Text]; Sergeant, Paul [Extract] [Full Text]; Sheppard, Mary [Abstract] [Full Text]; Sherlaw-Johnson, Chris [Abstract] [Full Text]; Siepe, Matthias [Abstract] [Full Text]; Sihoe, Alan D.L. [Abstract] [Full Text]; Simeoni, Eleonora [Abstract] [Full Text]; Smolenski, Ryszard T. [Abstract] [Full Text]; Sodha, Neel [Abstract] [Full Text]; Stickley, John [Abstract] [Full Text]; Stott, Anthony [Abstract] [Full Text]; Strand, Trond-Eirik [Abstract] [Full Text]; Stumper, Oliver [Abstract] [Full Text]; Stumper, Oliver F. [Abstract] [Full Text]; Sueda, Taijiro [Abstract] [Full Text]; Sugawara, Yuji [Abstract] [Full Text]; Surmen, Benguhan [Extract] [Full Text]; Swift, Simon [Abstract] [Full Text]
T: Talleraas, Olaug [Abstract] [Full Text]; Tan, Carol [Abstract] [Full Text]; Tanoue, Yoshihisa [Abstract] [Full Text]; Tastepe, Irfan [Abstract] [Full Text]; Thung, Kin-Hoi [Abstract] [Full Text]; Tireli, Emin [Extract] [Full Text]; Tominaga, Ryuji [Abstract] [Full Text]; Treasure, Tom [Abstract] [Full Text]; Trivin, François [Abstract] [Full Text]; Tsang, Victor T. [Abstract] [Full Text]; Tsilimingas, Nikolaos B. [Extract] [Full Text]; Tung, Thomas [Abstract] [Full Text]; Turrentine, Mark W. [Abstract] [Full Text]; Türüt, Hasan [Abstract] [Full Text]
U: Ugurlucan, Murat [Extract] [Full Text]
V: Vassalli, Giuseppe [Abstract] [Full Text]; Venuta, Federico [Abstract] [Full Text]; Venuta, Federico [Extract] [Full Text]; Vijay, Palaniswamy [Abstract] [Full Text]; Vitolo, Domenico [Extract] [Full Text]; Vohra, Hunaid A. [Abstract] [Full Text]; von Segesser, Ludwig K. [Abstract] [Full Text]
W: Wahlers, Thorsten [Extract] [Full Text]; Walker, William [Abstract] [Full Text]; Walther, Thomas [Abstract] [Full Text]; Wan, Innes Y.P. [Abstract] [Full Text]; Wan, Song [Abstract] [Full Text]; Watson, R. William G. [Abstract] [Full Text]; Weder, Walter [Abstract] [Full Text]; Wimmer-Greinecker, Gerhard [Abstract] [Full Text]; Wolner, Ernst [Abstract] [Full Text]; Wood, Alfred E. [Abstract] [Full Text]; Wright, John G. [Abstract] [Full Text]
Y: Yacoub, Magdi H. [Abstract] [Full Text]; Yap, John [Abstract] [Full Text]; Yim, Anthony P.C. [Abstract] [Full Text]; Yim, Anthony P.C. [Abstract] [Full Text]; Yip, Johnson H.Y. [Abstract] [Full Text]
Z: Zimpfer, Daniel [Abstract] [Full Text]; Zingone, Bartolo [Abstract] [Full Text]